Schaefer's Blog

Into this section you can find new products, new partners, news on the nanotechnology fields, on the vacuum and flow measurement, and on other fields of interest of our and yours business.

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Wednesday, February 24, 2016

5th Izon Science Research Symposium Announcement - Merton College - Oxford

5th Izon Science Research Symposium Announcement

We are delighted to invite you to the 5th Izon Science Research Symposium.

Date: 1st and 2nd September, 2016

Venue: Merton College, Oxford, UK.

Last year’s symposium was a tremendous success with over 15 presentations from...

Wednesday, February 17, 2016

HPM 4/5/6 “TCG Data Logger”

Teledyne Hastings - Pressure Control System and HPM 4/5/6 “TCG Data Logger”

Teledyne Hastings Instruments have been asked to develop a version of the HPM 4/5/6 that would allow the user to go from point-to-point along a cryo-line and record vacuum readings on a number of gauge tubes. The new version of the market leader HPM 4/5/6, the TCG Data Logger, can then be...

Friday, February 12, 2016

Prof. Pieter Cullis - University of British Columbia

Precision NanoSystems will host a webinar on the 18th of February with Prof. Pieter Cullis

In this webinar, Professor Pieter Cullis from the University of British Columbia will unpack the application of microfluidics for the preparation of "limit-size" lipid nanoparticle systems including liposomes, nanoemulsions and RNA-lipid nanoparticles (RNA-LNP)...

Tuesday, February 9, 2016

Sensofar s Lynx 3D non contact profiler

Sensofar introduces the new S Lynx - An Interview with Gerald Nitsch - CEO, Sensofar

Big news from Sensofar, the leading manufacturer in the optical metrology instruments field. It has been just announced a new optical 3D profiler, the S Lynx model. This instrument is the outcome of 14 years of research and development in this field. This model comes with a very small footprint...

Monday, February 8, 2016

New Mikromasch OPUS AFM - Optimized Positioning Upon Sample

Mikromasch introduces a new line of AFM probes: OPUS AFM

The key feature of OPUS™ is AFM tip visibility: OPUS™ AFM tips are positioned exactly at the end of each cantilever at an angle of 90 degrees, which enables a precise tip positioning on the sample to be measured.

OPUS™ tips are available on all standard cantilever types for all commonly...

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