The products distributed by Schaefer

DLS instrument for ultra-diluted sample or for extra-concentrated sample
3D Optical Profiler for SpeedQA/QC and R&D Solution
Hi'Res C - High Resolution silicon probes
High Resolution silicon probes
Mikromasch Co-Cr Coated probes
Magnetic Noncontact (NSC) silicon probes
Punte in silicio conduttive a Non Contatto (NSC), Contatto (CSC) e a 4-leve (XSC)
Conductive Noncontact (NSC), Contact (CSC) and 4-Lever (XSC) silicon probes

Pages